Interface controlled microstructure evolution in nanolayered thin films
نویسندگان
چکیده
منابع مشابه
Interface controlled microstructure evolution in nanolayered thin films
Article history: Received 17 March 2016 Received in revised form 21 May 2016 Accepted 22 May 2016 Available online 7 June 2016 X-ray nano-diffraction and transmission electron microscopy were conducted along the thickness of a ~4 μm thick CrN/AlN multilayer with continuously increasing AlN layer thicknesses from ~1 to 15 nm on ~7 nm thick CrN template layers. The experiments reveal coherent gro...
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ژورنال
عنوان ژورنال: Scripta Materialia
سال: 2016
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2016.05.031